US Patent Issued to LEICA MICROSYSTEMS CMS on Dec. 30 for "Method for examining a fluorescent sample, microscope system and computer program" (German Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,741, issued on Dec. 30, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method for examining a fluorescent sample, microscope system and computer program" was invented by Christian Schumann (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for examining a sample containing a target fluorophore j using a fluorescence microscope includes acquiring a series of sample images over an acquisition time interval, and adjusting an illumination parameter Pk in a plurality of iteration steps n during the acquisition time interval to different set values. The series of sample images are acquired after adjusting the illum...