US Patent Issued to LEENO INDUSTRIAL on Nov. 18 for "Test socket including probes formed of elastic material containing conductive particles and method of manufacturing the same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,373, issued on Nov. 18, was assigned to LEENO INDUSTRIAL INC. (Busan, South Korea).

"Test socket including probes formed of elastic material containing conductive particles and method of manufacturing the same" was invented by Woesuk Yang (Busan, South Korea) and Byeongcheol Lee (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sides of the base frame, and comprising elastic material having higher elast...