US Patent Issued to LEENO INDUSTRIAL on June 3 for "Test socket and method of fabricating the same" (South Korean Inventor)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,827, issued on June 3, was assigned to LEENO INDUSTRIAL INC. (Busan, South Korea).

"Test socket and method of fabricating the same" was invented by Seungha Baek (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, at least a portion of the internal film being electrically isolated from the external film."

The...