ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,364, issued on April 29, was assigned to LEADPOWER-SEMI Co. LTD. (Zhubei, Taiwan).
"Test system and test device" was invented by Cheng-Jyun Wang (Taoyuan, Taiwan), Po-Hsien Li (Taipei, Taiwan) and Jen-Hao Yeh (Hsinchu County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test system includes a to-be-tested die including a to-be-tested transistor and a sense transistor, and a test device including a signal amplifying unit, a testing unit, and a probe card connecting the signal amplifying unit and the testing unit to the die. The signal amplifying unit has a first terminal connected to the to-be-tested transistor, and second and third termina...