US Patent Issued to Lavorro on Nov. 4 for "Mean time between failure of semiconductor- fabrication equipment using data analytics with natural-language processing" (California Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,502, issued on Nov. 4, was assigned to Lavorro Inc. (Palo Alto, Calif.).

"Mean time between failure of semiconductor- fabrication equipment using data analytics with natural-language processing" was invented by Arya Priya Bhattacherjee (Livermore, Calif.), David Harrison Webster (Los Altos, Calif.) and Scott Michael Braun (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, a system includes a wafer handling system, processing components, a controller, a virtual assistant, a natural language processing (NLP) engine, and a data-analytics engine. The wafer handling system is configured to hold one or more wafers for proce...