ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,100, issued on May 20, was assigned to LAVCHIEFF Analytics GmbH (Gallneukirchen, Austria).
"Measurement system and method for obtaining information about a sample" was invented by Ventsislav Lavchiev (Gallneukirchen, Austria).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system for obtaining information about a sample comprises an excitation-beam source configured for irradiating the sample with an excitation-beam. The measurement system comprises a probe unit configured for exposing the sample to a probing radiation or a probing field, and a detection unit configured for obtaining a first information about an interaction of the probin...