US Patent Issued to Lanzhou University on Oct. 14 for "Single-ended test method for wave-absorbing characteristic of material" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,777, issued on Oct. 14, was assigned to Lanzhou University (Lanzhou, China).

"Single-ended test method for wave-absorbing characteristic of material" was invented by Xiling Li (Lanzhou, China), Liang Qiao (Lanzhou, China) and Jianbo Wang (Lanzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a single-ended test method for the wave-absorbing characteristic of a material. The device comprises a sample cavity, a microwave transmission rod, spring needles, an SMA joint and a vector network analyzer, wherein one end of the sample cavity is provided with a test fixture; the microwave transmission rod is arranged in the sample cavity a...