US Patent Issued to L&T TECHNOLOGY SERVICES on Oct. 21 for "Method of analyzing X-ray images and report generation" (Indian Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,451,236, issued on Oct. 21, was assigned to L&T TECHNOLOGY SERVICES Ltd. (Chennai, India).

"Method of analyzing X-ray images and report generation" was invented by Ashok Ajad (Uttar Pradesh, India), Taniya Saini (Gujarat, India), Ansuj Joshi (Madhya Pradesh, India) and Swaroop Kumar Mysore Lokesh (Karnataka, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of analyzing images and generating a report is disclosed. The method may include inputting a test image to a trained prediction model. The trained prediction model may be a deep learning-based model. The method may further include obtaining at least one abnormality associated with the tes...