ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,928, issued on April 8, was assigned to Landor Architecture Inc. (Seoul, South Korea).
"Location measuring system" was invented by Han Seok Nam (Seoul, South Korea) and James Patten (Brooklyn, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "This application relates to a location measuring system including a driving-type working device. In one aspect, the system includes a data receiving unit that receives marking data about a working surface, a marking unit that executes a marking operation with respect to the working surface corresponding to the marking data, and a scanning unit that scans a target space. The system may also include a scan cond...