US Patent Issued to Kyocera Corportion on Dec. 30 for "Event-based minimum drive test (MDT) log" (American, Japanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,537, issued on Dec. 30, was assigned to Kyocera Corportion (Kyoto, Japan).

"Event-based minimum drive test (MDT) log" was invented by Henry Chang (San Diego) and Masato Fujishiro (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A mobile wireless communication device (mobile device) receives a Minimization of Drive Test (MDT) configuration comprising criteria for performing event-based logging. The mobile device determines if the criteria have been met and, in response to a determination that the criteria have been met, performs an MDT in accordance with the MDT configuration. The MDT results are logged in the memory as an MDT log. The...