ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,839, issued on Nov. 11, was assigned to KUNSHAN GO-VISIONOX OPTO-ELECTRONICS Co. LTD (Kunshan, China).
"Bending test device" was invented by Xiangli Wu (Kunshan, China) and Xingxing Yang (Kunshan, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A bending test device. The bending test device includes a base and at least one carrier component disposed on the base, where each of the at least one carrier component includes a horizontal fixed portion and two moving portions rotatably connected to two sides of the horizontal fixed portion respectively, and each of the two moving portions has motion freedom to turn up and down relative to the horizont...