US Patent Issued to Kowa on Nov. 18 for "Image analysis method, learning image or analysis image generation method, learned model generation method, image analysis apparatus, and image analysis program" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,477,074, issued on Nov. 18, was assigned to Kowa Co. Ltd. (Nagoya, Japan).

"Image analysis method, learning image or analysis image generation method, learned model generation method, image analysis apparatus, and image analysis program" was invented by Katsumi Yabusaki (Tokyo) and Takao Shinohara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example apparatus comprising an image acquisition unit configured to acquire a plurality of images having temporal or spatial continuity; a channel assignment unit configured to assign a channel different from each other to at least a part of gradation information on a color and/or gradation information ...