US Patent Issued to KOREAN ELECTROTECHNOLOGY RESEARCH INSTITUTE on Dec. 2 for "Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using same" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,078, issued on Dec. 2, was assigned to KOREAN ELECTROTECHNOLOGY RESEARCH INSTITUTE (Gyeongsangnam-do, South Korea).

"Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using same" was invented by In Sung Park (Gyeongsangnam-do, South Korea), Gwan Tae Kim (Gyeongsangnam-do, South Korea), Ho Sup Kim (Gyeongsangnam-do, South Korea) and Hong Soo Ha (Gyeongsangnam-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for continuously measuring the thickness of a thin material includ...