US Patent Issued to KOREA UNIVERSITY OF TECHNOLOGY AND EDUCATION INDUSTRY- UNIVERSITY COOPERATION FOUNDATION on Jan. 28 for "Deep learning-based MLCC stacked alignment inspection system and method" (South Korean Inventors)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,061, issued on Jan. 28, was assigned to KOREA UNIVERSITY OF TECHNOLOGY AND EDUCATION INDUSTRY- UNIVERSITY COOPERATION FOUNDATION (Cheonan-si, South Korea).

"Deep learning-based MLCC stacked alignment inspection system and method" was invented by Heung-Seon Oh (Cheonan-si, South Korea), Sung Bin Son (Gumi-si, South Korea), Jun Uk Jung (Daegu, South Korea) and Hyun Jae Kim (Pyeongtaek-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deep learning-based MLCC stacked alignment inspection system includes an integrated defect detection unit configured to detect core areas requiring inspection of image data in which a stacked structure is p...