US Patent Issued to KOREA TESTING LABORATORY on March 11 for "Electromagnetic wave leakage measurement system" (South Korean Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,248,010, issued on March 11, was assigned to KOREA TESTING LABORATORY (Jinju-si, South Korea).

"Electromagnetic wave leakage measurement system" was invented by Hong Je Jang (Jinju-si, South Korea), Tae-seung Song (Jinju-si, South Korea) and Han Hee Lee (Jinju-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The electronic wave leakage measurement system according to the present invention is a system for measuring the electronic wave leakage of an electronic wave shielding structure. The system comprising a signal generator for generating an electronic wave generation signal; a transmitting antenna for transmitting the electronic wave tow...