US Patent Issued to KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE on Nov. 18 for "Calibration method for deflectometry method, for improving measurement accuracy" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,165, issued on Nov. 18, was assigned to KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE (Daejeon, South Korea).

"Calibration method for deflectometry method, for improving measurement accuracy" was invented by Young-Sik Ghim (Sejong, South Korea), The Manh Nguyen (Daejeon, South Korea) and Hyug-Gyo Rhee (Deajeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method that enables easy and fast calibration of deflectometry for measuring and analyzing the shape of a measurement target with a freeform surface in which the phase of the reference plane mirror, the geometric position information among the co...