US Patent Issued to Korea Institute of Science and Technology on March 4 for "Apparatus for detecting microplastics based on differential interference contrast microscope system" (South Korean Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,825, issued on March 4, was assigned to Korea Institute of Science and Technology (Seoul, South Korea).

"Apparatus for detecting microplastics based on differential interference contrast microscope system" was invented by Seok Won Hong (Seoul, South Korea), Jae Hun Kim (Seoul, South Korea), Jiyun Han (Seoul, South Korea) and Subeen Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to an apparatus for detecting microplastics based on optical technology, more particularly the present disclosure relates to an apparatus for detecting microplastics, which is capable of detecting and analyzing microplas...