US Patent Issued to Korea Astronomy and Space Science Institute on Dec. 30 for "Method of satellite precise orbit determination using parallactic refraction scale factor estimation" (South Korean Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,509,250, issued on Dec. 30, was assigned to Korea Astronomy and Space Science Institute (Daejeon, South Korea).

"Method of satellite precise orbit determination using parallactic refraction scale factor estimation" was invented by Eun Jung Choi (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining a precise orbit of a satellite through estimation of a parallactic refraction scale factor is proposed, the method includes inputting an initial estimate including initial orbit information of a satellite with respect to an observation epoch and the parallactic refraction scale factor; performing orbit propagation using a...