US Patent Issued to Korea Advanced Institute of Science and Technology on Dec. 30 for "Security analysis system and method based on negative testing for protocol implementation of LTE device" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,402, issued on Dec. 30, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea).

"Security analysis system and method based on negative testing for protocol implementation of LTE device" was invented by Yongdae Kim (Daejeon, South Korea), CheolJun Park (Daejeon, South Korea), Sangwook Bae (Daejeon, South Korea), BeomSeok Oh (Daejeon, South Korea), Jiho Lee (Daejeon, South Korea), Mincheol Son (Daejeon, South Korea) and Insu Yun (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a negative testing-based security analysis system for protocol implementation of an LTE device, and a method...