US Patent Issued to Korea Advanced Institute of Science and Technology on Dec. 2 for "Method for detecting fatigue crack in structure using long short-term memory network-based spectral noise reduction and nonlinear ultrasonic modulation, and system therefor" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,208, issued on Dec. 2, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea).

"Method for detecting fatigue crack in structure using long short-term memory network-based spectral noise reduction and nonlinear ultrasonic modulation, and system therefor" was invented by Hoon Sohn (Daejeon, South Korea) and Jin Ho Jang (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting fatigue cracks in a structure and a system therefore are disclosed. A vibration detection element detects vibration of the structure generated when the structure is excited at low and high frequencies and generat...