ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,495, issued on Oct. 21, was assigned to Koninklijke Philips N.V. (Eindhoven, Netherlands).
"Magnetic resonance examination method" was invented by Miha Fuderer (Bunnik, Netherlands), Jacques Den Boer (Son, Netherlands) and Filips Van Liere (Best, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic resonance examination method comprises acquisition of a set of magnetic resonance signals from magnetic spins in an object by way of a receiver antenna, the magnetic resonance signals' signal levels are related to an independent reference level that is independent of the receiver antenna's sensitivity to form a calibrated signal level of ...