ALEXANDRIA, Va., March 5 -- United States Patent no. 12,242,005, issued on March 4, was assigned to KONINKLIJKE PHILIPS N.V. (Eindhoven, Netherlands).
"Detection of bad detectors at idle state" was invented by Inon Berent (Haifa, Israel) and David Finzi (Haifa, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A fault checker system for an X-ray detector, comprising an input interface (IN) for receiving readings acquired by a target detector pixel not exposed to X-radiation. A converter (CV) is configured to convert the readings into a metric. A thresholder (CP) is configured to compare the metric against at least one threshold and, based on the comparing, provide an indication on whether the detector pi...