ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,655, issued on Jan. 27, was assigned to KONINKLIJKE PHILIPS N.V. (Eindhoven, Netherlands).
"Detecting abnormalities in an x-ray image" was invented by Richard Vdovjak (Waalre, Netherlands) and Dimitrios Mavroeidis (Eindhoven, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a system (200) for detecting one or more abnormalities in an x-ray image using an image classifier and one or more feature extractors. An abnormality is indicative of a pathology, a disease or a clinical finding present in the x-ray image. The feature extractors extract respective image quality features from the x-ray image indicative of a suita...