US Patent Issued to KONICA MINOLTA on Sept. 30 for "Electrical characteristic parameter inspection apparatus, electrical characteristic parameter inspection method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,447, issued on Sept. 30, was assigned to KONICA MINOLTA INC. (Tokyo).

"Electrical characteristic parameter inspection apparatus, electrical characteristic parameter inspection method, and storage medium" was invented by Makoto Takada (Takatsuki, Japan), Junichi Jono (Tokyo) and Masaru Fuse (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electrical characteristic parameter inspection apparatus includes multiple sensors to be arranged on or over an object and a hardware processor. The hardware processor selects multiple predetermined selection patterns, each of the selection patterns including a sensor pair, the sensor pair includin...