US Patent Issued to KOKUSAI ELECTRIC SEMICONDUCTOR SERVICE on Jan. 13 for "Method of measuring resistivity, method of manufacturing semiconductor device, recording medium, and resistivity measuring device" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,491, issued on Jan. 13, was assigned to KOKUSAI ELECTRIC SEMICONDUCTOR SERVICE INC. (Toyama, Japan).

"Method of measuring resistivity, method of manufacturing semiconductor device, recording medium, and resistivity measuring device" was invented by Chihiro Tetsuyama (Toyama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a technique that includes (a) receiving a recipe for measuring an object to be measured; (b) calculating an estimated time when measuring the object according to a setting order of respective measurement points set in the recipe; (c) changing the setting order of the respective measurement points set in the r...