US Patent Issued to KLA on Oct. 14 for "Rare event training data sets for robust training of semiconductor yield related components" (American, Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,174, issued on Oct. 14, was assigned to KLA Corp. (Milpitas, Calif.).

"Rare event training data sets for robust training of semiconductor yield related components" was invented by Jan Lauber (San Francisco), Sabyasachi Das (Hsinchu, Taiwan) and Jason Kirkwood (Mountain View, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems for determining information for a specimen are provided. One method includes collecting images of known rare defect types previously detected on one or more other specimens and assigning training labels to the images responsive to the known rare defect types in the images. The method also includes storing ...