US Patent Issued to KLA, National Institute of Advanced Industrial Science and Technology on June 24 for "Electron gun and electron microscope" (American, Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,969, issued on June 24, was assigned to KLA Corp. (Milpitas, Calif.) and National Institute of Advanced Industrial Science and Technology (Tokyo).

"Electron gun and electron microscope" was invented by Yung-Ho Alex Chuang (Cupertino, Calif.), Yinying Xiao-Li (San Jose, Calif.), Edgardo Garcia Berrios (San Jose, Calif.), John Fielden (Los Altos, Calif.), Lavinia Ghirardini (San Jose, Calif.) and Masayoshi Nagao (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electron gun for an electron microscope or similar device includes a field emitter cathode having a field emitter protrusion extending from the output surface of a monocrystalli...