US Patent Issued to Kioxia on May 13 for "Semiconductor device, inspection component, and inspection device" (Japanese Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,342, issued on May 13, was assigned to Kioxia Corp. (Tokyo).

"Semiconductor device, inspection component, and inspection device" was invented by Kohei Ide (Kamakura, Japan) and Kenshi Fukuda (Kamakura, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to one embodiment, a semiconductor device includes a board, a plurality of external connection terminals, a semiconductor component, and an insulator. The board includes a first surface and a second surface. The second surface is located on a side opposite to the first surface. The plurality of external connection terminals is on the first surface. The semiconductor component is located on...