US Patent Issued to Kioxia on March 18 for "Inspection result analysis device, inspection result analysis method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,247, issued on March 18, was assigned to Kioxia Corp. (Tokyo).

"Inspection result analysis device, inspection result analysis method, and storage medium" was invented by Yasushi Arimura (Yokkaichi, Japan), Mizuka Nishio (Yokkaichi, Japan) and Yukio Yoshinaga (Suzuka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection result analysis device includes a processor. The processor factorizes each first distribution of a first distribution group into a second distribution group and a weight group corresponding to the second distribution group by non-negative matrix factorization of the first distribution group. Each first distribution is a...