US Patent Issued to KIOXIA on June 17 for "Techniques for testing PLP capacitors" (California Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,710, issued on June 17, was assigned to KIOXIA Corp. (Tokyo).

"Techniques for testing PLP capacitors" was invented by Paul Abrahams (San Jose, Calif.) and Ilya Shlimenzon (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A solid state drive (SSD) with improved techniques for testing power loss protection (PLP) capacitors and a method for testing PLP capacitors of SSDs is disclosed. In one embodiment, the SSD includes a memory controller and one or more non-volatile memory devices and a volatile memory device coupled to the memory controller. The SSD also includes a PLP capacitor configured to supply a first voltage to the memory contr...