US Patent Issued to KIOXIA on Jan. 13 for "Level difference measuring apparatus and method of calculating level difference" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,677, issued on Jan. 13, was assigned to KIOXIA Corp. (Tokyo).

"Level difference measuring apparatus and method of calculating level difference" was invented by Kiminori Yoshino (Kuwana Mie, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A level difference measuring apparatus that measures a level difference on a specimen surface having unevenness formed thereon includes: an atomic force microscope configured to measure a surface height of each of a plurality of measurement points set on the specimen surface; and a level difference calculation unit configured to calculate the level difference in a measurement target area including the plurality...