US Patent Issued to KIOXIA on Dec. 2 for "Systems and methods for PLP capacitor health check" (British, American Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,262, issued on Dec. 2, was assigned to KIOXIA Corp. (Tokyo).

"Systems and methods for PLP capacitor health check" was invented by Timothy Simon Butler (Didcot, Great Britain) and Paul Abrahams (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various implementations described herein relate to systems and methods for determining abnormal leakage current of a capacitor by determining a number of recent leakage current values for the capacitor and determining a maximum upper limit, minimum upper limit, maximum lower limit, and minimum lower limit based on leakage current values different from the recent leakage current values. A present u...