US Patent Issued to Khalifa University of Science and Technology on March 4 for "System and method for selective ion monitoring" (Emirati Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,822, issued on March 4, was assigned to Khalifa University of Science and Technology (Abu Dhabi, United Arab Emirates).

"System and method for selective ion monitoring" was invented by Abdellatif Bouchalkha (Abu Dhabi, United Arab Emirates), Radouane Karli (Abu Dhabi, United Arab Emirates), Khalid Alhammadi (Abu Dhabi, United Arab Emirates) and Mohammed Serhan (Abu Dhabi, United Arab Emirates).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a system and method of selectively monitoring ions in a fluid medium using a graphene sensor, the method comprising the step of adjusting an operating frequency of the graphene sensor to a particu...