US Patent Issued to KEYSIGHT TECHNOLOGIES on Sept. 23 for "Method and system for testing device under test (DUT) over long distance" (California Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,111, issued on Sept. 23, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Method and system for testing device under test (DUT) over long distance" was invented by Keith Frederick Anderson (Santa Rosa, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system synchronize first and second VNAs for testing a DUT over a long distance. The method includes receiving at the second VNA an RF signal from the first VNA; mixing the RF signal and an LO signal at the second VNA to output an IF signal to an ADC; determining a reference error ratio between a first reference clock in the first VNA and a second reference clock in t...