US Patent Issued to KEYSIGHT TECHNOLOGIES on July 29 for "System and method for measuring modulation distortion error vector magnitude (EVM) of a device under test (DUT)" (California Inventor)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,561, issued on July 29, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"System and method for measuring modulation distortion error vector magnitude (EVM) of a device under test (DUT)" was invented by Rishi Mohindra (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Measuring MDEVM of a DUT includes splitting an RF signal output by a DUT into first and second RF signals; acquiring and digitizing the first and second RF signals in first and second channels without demodulating the first and second RF signals; performing equalization of the first and second RF signals; measuring first and second modulation distortion...