US Patent Issued to KEYSIGHT TECHNOLOGIES on July 15 for "Method and apparatus for predicting failure of a component" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,164, issued on July 15, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Method and apparatus for predicting failure of a component" was invented by Masaharu Goto (Hanno, Japan), Kiyoshi Chikamatsu (Tokyo) and Naoki Kobayashi (Machida, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method is provided for finding events that predict failure of an electronic component of a data processing system. The method includes extracting EDSs from a data stream including an output of the electronic component as a function of time, each EDS satisfying an extraction protocol and being characterized by a time stamp indicating a time at whic...