US Patent Issued to KEYSIGHT TECHNOLOGIES on Jan. 27 for "System and apparatus for testing magnetoresistive random access memory (MRAM) devices" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,524, issued on Jan. 27, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"System and apparatus for testing magnetoresistive random access memory (MRAM) devices" was invented by Sumio Shimonishi (Inagi, Japan) and Ryo Suzuki (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for measuring a resistance (R)-magnetic field (H) curve of a magnetoresistive random-access memory (MRAM) device is described. The system includes a calibration fixture adapted to provide initial measured magnetic field data for setting a measured distance and a coil current of a coil of an electromagnet for a plurality of magnetic...