US Patent Issued to KEYSIGHT TECHNOLOGIES on Dec. 30 for "Determining frequency offset of signal under test" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,038, issued on Dec. 30, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Determining frequency offset of signal under test" was invented by Wei Tang (Beijing), Rui Zhu (Beijing) and Xingchen Duan (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "To estimate the frequency offset of time domain multi-tone base-band in-phase and quadrature (IQ) data signal, an initial frequency offset is estimated based on a partial frequency-bin offset estimation in the time domain. The estimated initial frequency offset is compensated, and a resultant compensated signal is transformed to the frequency domain. A remaining frequency offset of the...