ALEXANDRIA, Va., June 5 -- United States Patent no. 12,278,714, issued on April 15, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).
"RF distortion analysis and gain compression characterization based on waveform creation" was invented by Mark Hanni (Colorado Springs, Colo.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A controller includes a memory that stores instructions; and a processer that executes the instructions. When executed by the processor, the instructions cause the controller to provide a waveform based on an IQ baseband waveform data array; initialize a signal analysis device to acquire a modulated radio frequency signal which is based on the IQ baseband waveform data array; ...