ALEXANDRIA, Va., June 10 -- United States Patent no. 12,292,375, issued on May 6, was assigned to KEYENCE Corp. (Osaka, Japan).
"Analysis device" was invented by Ryosuke Imai (Osaka, Japan) and Kenichiro Hirose (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis and observation device includes: an electromagnetic wave emitter that emits a primary electromagnetic wave; a reflective object lens having a primary mirror provided with a primary reflection surface reflecting a secondary electromagnetic wave and a secondary mirror provided with a secondary reflection surface receiving and further reflecting the secondary electromagnetic wave; first and second detectors that receive the secondar...