US Patent Issued to KEYENCE on May 27 for "Appearance inspection apparatus and appearance inspection method" (Japanese Inventor)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,132, issued on May 27, was assigned to KEYENCE Corp. (Osaka, Japan).

"Appearance inspection apparatus and appearance inspection method" was invented by Xinliang Zhao (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "When a machine learning network trained with both a non-defective product image and a defective product image is used, it is possible to stably exhibit high detection capability for the defective product image having an unknown defect while shortening a takt time during the operation time. A processor executes a first learning process of causing a machine learning network to learn a non-defective product image added with a noi...