ALEXANDRIA, Va., June 12 -- United States Patent no. 12,299,870, issued on May 13, was assigned to KEYENCE Corp. (Osaka, Japan).
"Image inspection apparatus and image inspection method" was invented by Yuichiro Hama (Osaka, Japan), Keisuke Fukuta (Osaka, Japan) and Nobuyuki Kurihara (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The image inspection apparatus includes an image score calculator and an imaging condition specifier. The image score calculator calculates scores of images, which are produced under different imaging conditions. The imaging condition specifier receives, when two or more thumbnails corresponding to two or more of the images that have a higher score are displayed on the ...