US Patent Issued to KES SYSTEMS & SERVICE (1993) on Sept. 30 for "Probe assembly for test and burn-in having a compliant contact element" (Singaporean Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,502, issued on Sept. 30, was assigned to KES SYSTEMS & SERVICE (1993) PTE LTD. (Singapore).

"Probe assembly for test and burn-in having a compliant contact element" was invented by Hock Soon Sim (Singapore) and Zhiyun Ke (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A vertical probe assembly having a resilient compliant probe, a first guide plate, a second guide plate, and a third guide plate is disclosed. The probe may include an upper portion, a lower portion, and a stopper structure positioned between the upper and lower portions of the first probe. The first, second, and third guide plates may be formed from a non-conductive substra...