US Patent Issued to Keithley Instruments on Dec. 16 for "Unified measurement system for static and dynamic characterization of a device under test" (Ohio, Oregon, North Carolina Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,414, issued on Dec. 16, was assigned to Keithley Instruments LLC (Solon, Ohio).

"Unified measurement system for static and dynamic characterization of a device under test" was invented by Gregory Sobolewski (Brecksville, Ore.), Jeffrey J. Trgovich (Macedonia, Ohio), Brian D. Smith (Whitsett, N.C.) and James D. Bucci (Cleveland Heights, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection...