US Patent Issued to Keio University, National University Corporation National Higher Education and Research System on July 22 for "Method for detecting SLE" (Japanese Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,569, issued on July 22, was assigned to Keio University (Tokyo) and National University Corporation National Higher Education and Research System (Nagoya, Japan).

"Method for detecting SLE" was invented by Akiyoshi Hirayama (Tsuruoka, Japan), Tomoyoshi Soga (Tsuruoka, Japan), Shoichi Maruyama (Nagoya, Japan) and Shinichi Akiyama (Nagoya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to provide a method capable of detecting whether a subject has systemic lupus erythematosus (preferably nephrotic syndrome) with high accuracy without performing a renal biopsy, a biomarker for carrying out such detection, and...