US Patent Issued to Kawasaki Jukogyo on Feb. 10 for "Robot and substrate shape abnormality examination method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,544,934, issued on Feb. 10, was assigned to Kawasaki Jukogyo K.K. (Kobe, Japan).

"Robot and substrate shape abnormality examination method" was invented by Ippei Shimizu (Kobe, Japan), Hiroyuki Okada (Kakogawa, Japan), Daisuke Yamanaka (Oshu, Japan), Takahiro Abe (Fuchu, Japan) and Junichi Sato (Oshu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A robot that transfers a substrate includes an arm, a hand, a substrate detector, and a substrate shape abnormality examiner. The hand is installed to the arm and holds and transfers the substrate. The substrate detector detects absence or presence of the substrate in a non-contact manner. The substrate ...