US Patent Issued to KAPITO on June 17 for "Automatic target image acquisition and calibration system for inspection" (Taiwanese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,335,625, issued on June 17, was assigned to KAPITO INC. (Hsinchu, Taiwan).

"Automatic target image acquisition and calibration system for inspection" was invented by Feng-Tso Sun (Hsinchu, Taiwan), Yi-Ting Yeh (Hsinchu, Taiwan), Feng-Yu Sun (Hsinchu, Taiwan), Jyun-Tang Huang (Hsinchu, Taiwan), Rong-Hua Chang (Hsinchu County, Taiwan), Yi-Hsiang Tien (Nantou County, Taiwan) and Meng-Tse Shen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic target image acquisition and calibration system for application in a defect inspection system is disclosed. During the defect inspection system working normally, the automatic target image ac...