US Patent Issued to Kanadevia on Jan. 20 for "Inspection device, inspection method, and inspection program" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,684, issued on Jan. 20, was assigned to Kanadevia Corp. (Osaka, Japan).

"Inspection device, inspection method, and inspection program" was invented by Takahiro Wada (Osaka, Japan), Ryota Ioka (Osaka, Japan), Kaoru Shinoda (Osaka, Japan) and Takeru Katayama (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Determination of presence or absence of a defect having irregular position, size, shape, and/or the like in an image are made automatically. An inspection device includes: an inspection image obtaining section that obtains an inspection image used to determine presence or absence of an internal defect in an inspection target; and a defec...