ALEXANDRIA, Va., July 30 -- United States Patent no. 12,373,322, issued on July 29, was assigned to Juniper Networks Inc. (Sunnyvale, Calif.).

"Machine learning for metric collection" was invented by Raja Kommula (Cupertino, Calif.), Ganesh Byagoti Matad Sunkada (Bengaluru, India), Thayumanavan Sridhar (Sunnyvale, Calif.), Thiraviya Eswaran (Karur, India) and Raj Yavatkar (Los Gatos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A performance monitoring system includes a metric collector configured to receive, via metric exporters, telemetry data comprising metrics related to a network of computing devices. A metric time series database stores related metrics. An alert rule evaluator service is confi...