ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,217, issued on June 17, was assigned to JTEKT Corp. (Kariya, Japan).
"Ultrasonic inspection apparatus" was invented by Yousuke Nagano (Yao, Japan) and Akihiro Kariya (Yokohama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An ultrasonic inspection apparatus includes a transmitting and a receiving probe. The transmitting probe includes a first contact part having a first convex cylindrical surface in line contact with the curved surface, and a transmitting element configured to transmit an ultrasonic wave to the first surface. The receiving probe includes a second contact part having a second convex cylindrical surface, and a receiving element...